Physical Principles of Electron Microscopy An Introduction to Tem Sem and Aem
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
| Publisher Name | Springer |
|---|---|
| Author Name | Hagendorf, Col |
| Format | Audio |
| Bisac Subject Major | SCI |
| Language | NG |
| Isbn 10 | 0387258000 |
| Isbn 13 | 9780387258003 |
| Target Age Group | min:NA, max:NA |
| Dimensions | 00.96" H x 60.06" L x 10.00" W |
| Page Count | 202 |
